Team Leader
Research topics
The Laboratory of Semiconductor Characterization is part of the Institute of High Pressure Physics at the Polish Academy of Sciences. Using a variety of research methods, such as electron microscopy, X-ray diffraction, deep level transient spectroscopy (DLTS), atomic force microscopy, and secondary ion mass spectrometry (SIMS), we characterize crystals and epitaxial layers of semiconductors, as well as other materials. These techniques provide information about the structural quality of the materials under study and enable the identification of defects.
Team Leader
Team Members
Research Assistant
Research Assistant
Assistant Professor
Technician
Assistant Professor
Assistant Professor
Assistant Professor
Professor
Assistant Professor
Assistant Professor
News
30/04/2026
The profession of a scientist and the GaN crystal properties
03/02/2026
Call for abstracts – DRIP21
Projects
Artur Lachowski-
August 2025
August 2028
- Michał Leszczyński
-
April 2025
March 2028
- Michał Leszczyński
-
June 2023
June 2026
Equipment
Fabrication of materials and structures
Fabrication of materials and structures
Fabrication of materials and structures
Sample preparation for transmission electron microscopy (TEM)
Characterization of materials and devices
FEI Tecnai G2 F20 S-TWIN Transmission Electron Microscope (200 kV)
Characterization of materials and devices
Characterization of materials and devices
Characterization of materials and devices
Characterization of materials and devices