Team Leader
Research topics
The Laboratory of Semiconductor Characterization is part of the Institute of High Pressure Physics at the Polish Academy of Sciences. Using a variety of research methods, such as electron microscopy, X-ray diffraction, deep level transient spectroscopy (DLTS), atomic force microscopy, and secondary ion mass spectrometry (SIMS), we characterize crystals and epitaxial layers of semiconductors, as well as other materials. These techniques provide information about the structural quality of the materials under study and enable the identification of defects.
Team Leader
Team Members
Research Assistant
Research Assistant
Technician
Technician
Assistant Professor
Assistant Professor
Professor
Assistant Professor
Assistant Professor
News
Ongoing Projects
Artur Lachowski
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August 2025 August 2028
Michał Leszczyński
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April 2025 March 2028
Michał Leszczyński
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June 2023 June 2027
Grzegorz Staszczak
National Science Center
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January 2022 January 2027
Robert Czernecki
National Science Center
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January 2022 January 2027
Completed Projects
Julita Smalc-Koziorowska
National Science Center
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December 2021 June 2026
Ewa Grzanka
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January 2022 January 2026
Joanna Moneta
National Science Center
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August 2024 August 2025
Piotr Kruszewski
National Science Center
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January 2021 April 2025
Michał Leszczyński
Narodowe Centrum Nauki
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January 2020 January 2025
Michał Leszczyński
National Science Center
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February 2020 May 2024
Michał Leszczyński
National Science Center
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January 2019 December 2023
Robert Czernecki
National Center for Research and Development
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November 2019 October 2023
Michał Leszczyński
Narodowe Centrum Badań i Rozwoju
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September 2020 July 2023
Monika Masłyk
National Science Center
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October 2021 February 2023
Julita Smalc-Koziorowska
Narodowe Centrum Nauki
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March 2017 March 2022
Michał Leszczyński
Foundation for Polish Science
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September 2017 May 2021
Equipment
Fabrication of materials and structures
Fabrication of materials and structures
Fabrication of materials and structures
Sample preparation for transmission electron microscopy (TEM)
Characterization of materials and devices
FEI Tecnai G2 F20 S-TWIN Transmission Electron Microscope (200 kV)
Characterization of materials and devices
Characterization of materials and devices
Characterization of materials and devices
Characterization of materials and devices