Name: Spektrometr Mas Jonów Wtórnych CAMECA IMS 7f-Auto
Contact person: Dr inż. Artur Lachowski artur@unipress.waw.pl
Laboratory: NL-12
Location: ul. Strużańska 8, Stanisławów Pierwszy

Research capabilities and technical data

A dynamic secondary ion mass spectrometer with microbeam sources of oxygen and cesium ions. It uses an ion beam to atomize sample material and analyze the resulting secondary ions. It enables the determination of chemical composition and depth profiles with very high sensitivity

Back to equipment list