| Name: | Transmisyjny Mikroskop Elektronowy FEI Tecnai G2 F20 S-TWIN (200 kV) |
| Contact person: | Dr hab. inż. Julita Smalc-Koziorowska julita@unipress.waw.pl, Dr inż. Artur Lachowski artur@unipress.waw.pl, Dr inż. Joanna Moneta joanna.moneta@unipress.waw.pl |
| Laboratory: | NL-12 |
| Location: | al. Prymasa Tysiąclecia 98, Warszawa |
Research capabilities and technical data
The FEI Tecnai G2 F20 S-TWIN transmission electron microscope is an advanced tool for structural research of materials. It can operate in both TEM (Transmission Electron Microscopy) and STEM (Scanning TEM) modes, making it widely applicable in the study of nanostructured materials, metals, ceramics, semiconductors, and composites. The device is equipped with a Schottky field emission gun (FEG). Research techniques offered: BF/DF-TEM, low-beam imaging, electron diffraction, convergent beam diffraction (CBED, LACBED), High-Angle Annular Dark Field (HAADF) – STEM