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Usługi badawcze

Usługi badawcze

Characterization of materials and devices

Multifunctional SEM-based, characterization setup

Multifunctional SEM-based, characterization setup

Characterization of materials and devices

FEI Tecnai G2 F20 S-TWIN Transmission Electron Microscope (200 kV)

Characterization of materials and devices

Veeco Atomic Force Microscope (AFM)

Characterization of materials and devices

High-resolution X-ray diffractometer Empyrean Panalytical

Characterization of materials and devices

Measuring system for detecting deep trap states using DLTS (Deep Level Transient Spectroscopy), L-DLTS (Laplace DLTS), DLOS (Deep Level Optical Spectroscopy), and TAS (Thermal Admittance Spectroscopy) techniques

Characterization of materials and devices

Secondary Ion Mass Spectrometer CAMECA IMS 7f-Auto

Research equipment catalogue

The full catalogue of equipment in the Institute's laboratories – for fabrication of materials and structures, characterization of materials and devices, and computer modelling. Equipment availability and the scope of each service are agreed individually.

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