Equipment

Characterization of materials and devices

Multifunctional SEM-based, characterization setup

Characterization of materials and devices

Nanometer-precise direct optical butt-coupling system for PICs investigation

Characterization of materials and devices

Master oscillator power amplifier optical coupling system

Characterization of materials and devices

Ultra-high spectral resolution system for laser diode characterization

Characterization of materials and devices

Optical setup for temperature- and pressure-dependent photoluminescence measurements

Characterization of materials and devices

Overload tests of pressure vessels

Characterization of materials and devices

Cryogenic measurement of electrical properties

Characterization of materials and devices

Measurement of hydrogen diffusion through polymeric materials

Characterization of materials and devices

HOMMEL-TESTER T8000 Profilometer

Characterization of materials and devices

NIKON ECLIPSE LV150N metallographic microscope

Characterization of materials and devices

Scanning electron microscope HITACHI TM-3000 with EDS 300 Oxford attachment

Characterization of materials and devices

Zwick/Roell ZHV Hardness Tester