| Name: | Skaningowy mikroskop elektronowy HITACHI TM-3000 z przystawką EDS 300 Oxford |
| Contact person: | dr hab. inż. Mariusz Kulczyk, prof IWC PAN, mariusz@unipress.waw.pl |
| Laboratory: | NL-1 |
| Location: | Park Innowacyjny IWC PAN, Celestynów – Lasek |
Research capabilities and technical data
The microscope is equipped with an EDS X-ray microanalyser, which enables the study of the surface morphology of samples with high resolution, as well as conducting quantitative and qualitative analysis of the chemical composition of the studied samples. Basic technical data: • magnification: up to 30 000x • working conditions: 5 kV / 15 kV / EDS analysis • state-of-the-art semiconductor BSE (backscattered electron) detector • imaging modes: COMPO / Shadow 1 / Shadow 2 / TOPO • maximum sample diameter: 70mm • maximum sample height: 30mm • simple preparation of specimens – no need for metallic plating for non-conductive samples • possibility of stereoscopic observations with high resolution and great depth of field unattainable with optical microscopy