Equipment

Characterization of materials and devices

Station for analyzing particle size and zeta potential in liquid systems

Characterization of materials and devices

Station for analyzing the distribution of particles in liquids

Characterization of materials and devices

Scanning microscopy station

Characterization of materials and devices

Helium density measurement station

Characterization of materials and devices

Specific surface area measurement station

Characterization of materials and devices

Thermogravimetric testing station

Characterization of materials and devices

Nikon optical microscope

Fabrication of materials and structures

TAKATORI WSD‑K2 single‑wire saw (SWS)

Fabrication of materials and structures

Basic ammonothermal GaN crystallization reactors, φ=120 (4 units)

Fabrication of materials and structures

Basic ammonothermal GaN crystallization reactors, φ=100 (12 units)

Fabrication of materials and structures

Basic ammonothermal GaN crystallization reactors, φ=60 (4 units)

Fabrication of materials and structures

Basic ammonothermal GaN crystallization reactors, φ=40 (2 units)