| Name: | Dyfraktometr rentgenowski (XRD) |
| Contact person: | Arkadiusz Puchalski arkadiusz.puchalski@unipress.waw.pl |
| Laboratory: | NL-13 |
| Location: | ul. Strużańska 8 Stanisławów Pierwszy |
Research capabilities and technical data
X‑ray diffractometer for phase analysis, crystalline quality assessment and determination of orientation and lattice parameters. Used for diffraction measurements on powders and single crystals/epilayers (configuration‑dependent).