Institute of High Pressure Physics

One of the most formidable barriers in development of nitride-based optoelectronic devices: laser diodes (LDs) and light emitting diodes (LEDs) is high resistance of the metal/p-type nitride contact. The present date solutions are mostly based on Ni/Au contact still they are far from satisfactory. The situation requires basic investigations of the contact nature and technical implementation of new designs. Researchers from IHPP PAS applied complex ab initio and drift-diffusion calculation to elucidate contact nature. The results obtained include:

• elucidation of basic nature of the contact,
• evidence that in any metal/p-type GaN contact there exist tunneling barrier,
• explanation of the role of oxygen-ambient annealing during formation of the Ni-Au contact,
• new design, based on multilayer arrangement of deep acceptors, to achieve low resistance contact.

These results were published in the paper in Electronics vol. 14, p. 3309 (2025): Fundamentals of Metal Contact to p-Type GaN—A New Multilayer Energy-Saving Design Konrad Sakowski, Cyprian Sobczak, Pawel Strak, Stanislaw Krukowski

This study opens a new possibility of application of the new design by implantation formation of the low resistance electric contacts in the near future.